Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers

E.P.C. Lai (Edward), Silundika, Cecilia S., Wylie, Ian W. and Guo, Runde

1990-12-01

Spectrochimica acta reviews , Volume 13 - Issue 5 p. 377- 398

Additional Metadata
Journal	Spectrochimica acta reviews
Organisation	Carleton University
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Lai, E.P.C, Silundika, Cecilia S., Wylie, Ian W., & Guo, Runde. (1990). Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers. Spectrochimica acta reviews, 13(5), 377–398.

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