Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers

E. P. Lai (Edward), Silundika, Cecilia S., Wylie, Ian W. and Guo, Runde

1990-12-01

Spectrochimica acta reviews , Volume 13 - Issue 5 p. 377- 398

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Journal	Spectrochimica acta reviews
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Lai, E. P, Silundika, Cecilia S., Wylie, Ian W., & Guo, Runde. (1990). Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers. Spectrochimica acta reviews, 13(5), 377–398.

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