Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers

E. P. Lai (Edward), Silundika, Cecilia S., Wylie, Ian W. and Guo, Runde

1990-12-01

Spectrochimica acta reviews , Volume 13 - Issue 5 p. 377- 398

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Journal	Spectrochimica acta reviews
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style BibTex Format Endnote Format RIS Format CSL Format	Lai, E. P, Silundika, Cecilia S., Wylie, Ian W., & Guo, Runde. (1990). Non-linear photothermal spectroscopic analysis of ion-implanted silicon wafers. Spectrochimica acta reviews, 13(5), 377–398.

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