Analytical models of high-speed interconnects are becoming increasingly important due to the large number and repetitive nature of signal integrity simulations. In this paper, closed-form relations are developed to calculate the characteristic impedance of differential traces routed on asymmetrical dual stripline layers. The solution is based on Schwartz-Christoffel transformation in combination with the partial capacitance concept. Numerical examples demonstrating the accuracy of the proposed method have been presented.

Additional Metadata
Keywords characteristic impedance, conformal mapping, differential traces, Schwartz-Christoffel transformation
Persistent URL dx.doi.org/10.1109/EDAPS.2015.7383704
Conference IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015
Citation
Erdin, I. (Ihsan), & Achar, R. (2016). Characteristic impedance of asymmetrical differential traces: Closed-form relations for signal integrity analysis. In 2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015 (pp. 43–45). doi:10.1109/EDAPS.2015.7383704