Additional Metadata
Keywords Circuit simulation, High-speed interconnects, Integrated congruence transform, Nonuniform transmission lines, Sensitivity computation, Simulation and analysis
Persistent URL dx.doi.org/10.1109/TADVP.2004.841675
Journal IEEE Transactions on Advanced Packaging
Citation
Gad, E. (Emad), & Nakhla, M.S. (2005). Simulation and sensitivity analysis of nonuniform transmission lines using integrated congruence transform. IEEE Transactions on Advanced Packaging, 28(1), 32–44. doi:10.1109/TADVP.2004.841675