We investigate the limits of frequency resolution attainable in a nonlinear waveguide optical spectrometer, including the effects that are due to surface distortions and waveguide inhomogeneities, and demonstrate that the frequency-resolving capability is directly scalable with the radiating aperture length. The resolution of the waveguide is diffraction limited, and therefore the far-field radiation pattern can be used to characterize the phase variations along the waveguide that are due to surface distortions. The use of this device as a highly sensitive deformation sensor is demonstrated by application of a distortion to the waveguide and confirmation of the far-field diffraction pattern generated.

Optics Letters
Department of Electronics

Janz, S., Frlan, E., Wight, J. S, Dai, H., Chatenoud, F., Buchanan, M., & Normandin, R. (1994). High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides. Optics Letters, 19(20), 1657–1659. doi:10.1364/OL.19.001657