A novel method is presented for time-domain statistical analysis of large active circuits with multiple stochastic parameters. It is based on a stability-preserving model order reduction algorithm coupled with stochastic collocation schemes. Pertinent numerical results validate the proposed method.

Additional Metadata
Persistent URL dx.doi.org/10.1109/EPEPS.2016.7835415
Conference 25th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2016
Citation
Guo, K., Ferranti, F., Nouri, B., & Nakhla, M.S. (2017). A stochastic collocation technique for time-domain variability analysis of active circuits. In 2016 IEEE 25th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2016 (pp. 47–49). doi:10.1109/EPEPS.2016.7835415