This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is estimated through a novel gain calibration technique.

Additional Metadata
Persistent URL dx.doi.org/10.1109/ANTEM.2004.7860690
Conference 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Antem/URSI 2004
Citation
Shamim, A. (Atif), Roy, L, Fong, N. (Neric), Tarr, G. (Gary), & Levenets, V. (Vlad). (2004). Si monolithic antenna calibration and de-embedding considerations. In Antem/URSI 2004 - 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Proceedings. doi:10.1109/ANTEM.2004.7860690