Material characterization using a quasi-optical measurement system
Application of a quasi-optical apparatus in the determination of the constituent parameters of materials is presented in this paper. Correction terms are introduced to remove the errors due to the misplacement of the sample and the calibration procedure. Good agreement was observed between manufacturer specifications and measurements after application of the correction terms.
|Conference||2002 Conference on Precision Electromagnetic Measurements|
Gagnon, N. (Nicolas), Shaker, J. (Jafar), Berini, P. (Pierre), Roy, L, & Petosa, A. (Aldo). (2002). Material characterization using a quasi-optical measurement system. In CPEM Digest (Conference on Precision Electromagnetic Measurements) (pp. 104–105).