Material characterization using a quasi-optical measurement system
The application of a quasi-optical apparatus in the determination of the relative permittivity of low-loss dielectric materials is presented in this paper. A description of the measurement system and its components is provided. Correction terms are introduced to remove errors due to the position tolerance of the sample and the calibration procedure. Two numerical methods are used to determine the relative permittivity from reflection and transmission coefficients. Good agreement was observed between corrected results obtained with the quasi-optical measurement system and measurements performed by an independent standards testing organization.
|Keywords||Dielectric materials, Dielectric measurements, Error correction, Gaussian beams, Genetic algorithms, Material parameter extraction, Permittivity measurement|
|Journal||IEEE Transactions on Instrumentation and Measurement|
Gagnon, N. (Nicolas), Shaker, J. (Jafar), Berini, P. (Pierre), Roy, L, & Petosa, A. (Aldo). (2003). Material characterization using a quasi-optical measurement system. IEEE Transactions on Instrumentation and Measurement, 52(2), 333–336. doi:10.1109/TIM.2003.810042