Cube probe structures for integrated near-field scanner module
Two new miniature near-field 'cube probe' structures for EMC/EMI measurements are proposed. Their performances are compared to those of the classical H-field loop probe in two orthogonal planes. The single cube probe effectively replaces three conventional orthogonally oriented loops. An array of cube probes is also proposed to form a near-field scan module dedicated to the characterisation of integrated circuit radiated emissions.