Two new miniature near-field 'cube probe' structures for EMC/EMI measurements are proposed. Their performances are compared to those of the classical H-field loop probe in two orthogonal planes. The single cube probe effectively replaces three conventional orthogonally oriented loops. An array of cube probes is also proposed to form a near-field scan module dedicated to the characterisation of integrated circuit radiated emissions.

Additional Metadata
Persistent URL dx.doi.org/10.1049/el:20080836
Journal Electronics Letters
Citation
Boyer, A., Roy, L, Sicard, E., & Tamer, B. (2008). Cube probe structures for integrated near-field scanner module. Electronics Letters, 44(11), 667–669. doi:10.1049/el:20080836