Additional Metadata
Keywords Microwave and mm-wave IC, noise measurement, noise parameters, on-wafer characterization
Persistent URL dx.doi.org/10.1109/75.769529
Journal IEEE Microwave and Guided Wave Letters
Citation
Béland, P. (Paul), Labonté, S. (Sylvain), Roy, L, & Stubbs, M. (Malcolm). (1999). A Novel On-Wafer Resistive Noise Source. IEEE Microwave and Guided Wave Letters, 9(6), 227–229. doi:10.1109/75.769529