On-chip antenna measurements: Calibration and de-embedding considerations
This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is easily estimated through a novel gain calibration technique. Finally, near to far field transformation is employed to extract full radiation patterns.
|Keywords||Balun, De-embedding, Gain measurement, On-chip antenna|
|Conference||IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference|
Shamim, A. (Atif), Roy, L, Fong, N. (Neric), Tarr, G. (Gary), & Levenets, V. (Vlad). (2005). On-chip antenna measurements: Calibration and de-embedding considerations. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (pp. 463–466).