Microstrip discontinuity modeling for high-speed interconnects
The development of lumped-element models for arbitrary microstripline discontinuities is described. An EM-based methodology is employed, consisting of initial characterization of the discontinuities using exact EM field solvers, and subsequent fitting of the results to simple equivalent circuits. The applicability of the method is illustrated by considering a microstrip slit example.
|Conference||Proceedings of the 1995 Canadian Conference on Electrical and Computer Engineering. Part 1 (of 2)|
Roy, L, Labonte, S., & Li, M. (1995). Microstrip discontinuity modeling for high-speed interconnects. In Canadian Conference on Electrical and Computer Engineering (pp. 374–376). doi:10.1109/CCECE.1995.528153