Quasi-optical measurement system for material characterisation
In most MMIC and antenna applications, an accurate knowledge of the relative permittivity of materials is required. At EHF, the two-port transmission/reflection quasi-optical measurement system is an attractive solution due to its contactless and non-destructive nature and to the simplicity of sample preparation. The quasi-optical apparatus consists of a pair of collinear horn-fed lenses. The sample to be tested is inserted midway between the two lenses. The horn-fed lenses create a Gaussian plane wave at the sample location, which allows plane wave theory to be used in the calculations. Figure 1 shows a representation of the measurement system.
|Conference||2002 International Symposium on Antenna Technology and Applied Electromagnetics, Antem 2002|
Gagnon, N. (Nicolas), Roy, L, Shaker, J. (Jafar), & Petosa, A. (Aldo). (2002). Quasi-optical measurement system for material characterisation. In Antem 2002 - International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings.