Surface roughness interpretation of 730 kg days CRESST-II results
The analysis presented in the recent publication of the CRESST-II results  finds a statistically significant excess of registered events over known background contributions in the acceptance region and attributes the excess to a possible Dark Matter signal, caused by scattering of rather light WIMPs. We propose a mechanism which explains the excess events with ion sputtering caused by 206Pb recoils and α-particles from 210Po decay, combined with realistic surface roughness effects.
|Keywords||210Po, CRESST, Dark Matter, Low background, Sputtering, Surface roughness, WIMP|
Kuźniak, M. (M.), Boulay, M.G, & Pollmann, T. (T.). (2012). Surface roughness interpretation of 730 kg days CRESST-II results. Astroparticle Physics, 36(1), 77–82. doi:10.1016/j.astropartphys.2012.05.005