We use the LOCal oxidation of silicon (LOCOS) method as a fabrication technique to define submicrometer photonic waveguides. We attempted fabricating the wire waveguides with two different masking processes, one with a stack of pad oxide and silicon nitride layers, and the other with a single silicon nitride layer. The smallest waveguide we achieved had a cross-section profile of 280 nm × 650 nm. The propagation loss of the waveguides was measured by the cut-back method, and the bending loss was measured by employing the serpentine pattern. The minimum propagation loss achieved was 8.78 dB /cm and the bending loss was 0.0089 dB /90° bend for a 5 μm bending radius.

Additional Metadata
Persistent URL dx.doi.org/10.1364/AO.51.007089
Journal Applied Optics
Citation
Xiong, Y. (Yule), Ibrahim, M. (Marc), & Ye, W.N. (2012). Impact of LOCOS techniques on photonic wire waveguides. Applied Optics, 51(29), 7089–7093. doi:10.1364/AO.51.007089