Time-domain variability analysis of large circuits with stochastic linear terminations

Tao, Y.; Guo, K.; Ferranti, F.; Nouri, B.; Nakhla, Michel S.; Achar, Ram

doi:10.1109/SaPIW.2017.7944003

Tao, Y. (Y.), Guo, K. (K.), Ferranti, F. (F.), Nouri, B. (B.), M.S. Nakhla (Michel S.) and R. Achar (Ram)

2017-06-07

Time-domain variability analysis of large circuits with stochastic linear terminations

Presented at the 21st IEEE Workshop on Signal and Power Integrity, SPI 2017 (May 2017), Lake Maggiore (Baveno)

An non-intrusive technique is proposed for time-domain variability analysis of large circuits with multiple stochastic parameters and stochastic terminations. A stochastic collocation technique is used in combination with a moment matching parameterized model order reduction approach and numerical inversion of Laplace transform. Pertinent numerical results validate the proposed method.

Additional Metadata
Persistent URL	dx.doi.org/10.1109/SaPIW.2017.7944003
Conference	21st IEEE Workshop on Signal and Power Integrity, SPI 2017
Organisation	Department of Electronics
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Tao, Y. (Y.), Guo, K. (K.), Ferranti, F. (F.), Nouri, B. (B.), Nakhla, M.S, & Achar, R. (2017). Time-domain variability analysis of large circuits with stochastic linear terminations. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. doi:10.1109/SaPIW.2017.7944003

Time-domain variability analysis of large circuits with stochastic linear terminations

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Time-domain variability analysis of large circuits with stochastic linear terminations

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