2017-06-07
Time-domain variability analysis of large circuits with stochastic linear terminations
Publication
Publication
Presented at the
21st IEEE Workshop on Signal and Power Integrity, SPI 2017 (May 2017), Lake Maggiore (Baveno)
An non-intrusive technique is proposed for time-domain variability analysis of large circuits with multiple stochastic parameters and stochastic terminations. A stochastic collocation technique is used in combination with a moment matching parameterized model order reduction approach and numerical inversion of Laplace transform. Pertinent numerical results validate the proposed method.
| Additional Metadata | |
|---|---|
| doi.org/10.1109/SaPIW.2017.7944003 | |
| 21st IEEE Workshop on Signal and Power Integrity, SPI 2017 | |
| Organisation | Department of Electronics |
|
Tao, Y. (Y.), Guo, K. (K.), Ferranti, F. (F.), Nouri, B. (B.), Nakhla, M.S, & Achar, R. (2017). Time-domain variability analysis of large circuits with stochastic linear terminations. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. doi:10.1109/SaPIW.2017.7944003
|
|