An non-intrusive technique is proposed for time-domain variability analysis of large circuits with multiple stochastic parameters and stochastic terminations. A stochastic collocation technique is used in combination with a moment matching parameterized model order reduction approach and numerical inversion of Laplace transform. Pertinent numerical results validate the proposed method.

Additional Metadata
Persistent URL dx.doi.org/10.1109/SaPIW.2017.7944003
Conference 21st IEEE Workshop on Signal and Power Integrity, SPI 2017
Citation
Tao, Y. (Y.), Guo, K. (K.), Ferranti, F. (F.), Nouri, B. (B.), Nakhla, M.S, & Achar, R. (2017). Time-domain variability analysis of large circuits with stochastic linear terminations. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. doi:10.1109/SaPIW.2017.7944003