Maker fringe measurement of thermally poled thin-film layered silica structures
In this presentation second harmonic generation from thermally poled multi-layer doped and un-doped silica structures is studied. We show that how SHG efficiency changes with respect to various dopant types, concentrations and duty cycle of thin-film samples.
|Nonlinear Photonics, NP 2018|
|Organisation||Department of Electronics|
Jafari, S.H. (Seyed Hamed), Aljamimi, S.M. (Salah M.), Albert, J, & Smelser, C. (2018). Maker fringe measurement of thermally poled thin-film layered silica structures. In Optics InfoBase Conference Papers. doi:10.1364/NP.2018.NpTh1C.7