Electromagnetic (EM)-based yield estimation is im-portant in microwave design due to uncertainties introduced by the manufacturing process. This paper provides an overview of recent advances in EM-based yield estimation, including polyno-mial chaos (PC)-based approaches and feature-based methods. Microwave filter examples are used to demonstrate the advan-tages of these advanced approaches.

Feature parameters, Microwave fitters, Polynomial chaos (PC), Statistical analysis, Yietd estimation
dx.doi.org/10.1109/NEMO.2018.8503128
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2018
Department of Electronics

Zhang, J. (Jianan), Zhang, C. (Chao), Feng, F. (Feng), Zhang, W. (Wei), & Zhang, Q.J. (2018). Recent Advances in EM-Based Yield Estimation. In 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2018. doi:10.1109/NEMO.2018.8503128