Mode indices measurements for both the TE and TM modes have been made on planar waveguides by K+-ion exchange in soda-lime glass substrates. These were directed toward establishing formulas for evaluating the effective guide depth and diffusion constant for both the TE and the TM modes, given the diffusion temperature and time. The corresponding surface-index change can also be determined.

doi.org/10.1364/OL.10.000151
Optics Letters
Department of Electronics

Yip, G.L. (Gar Lam), & Albert, J. (1985). Characterization of planar optical waveguides by K+-ion exchange in glass. Optics Letters, 10(3), 151–153. doi:10.1364/OL.10.000151