An investigation of coupling between inductors and resonators fabricated in silicon substrates is presented and the effects on RF systems and components are discussed. A novel experimental technique to measure inductor and resonator coupling is presented. The experiment is extremely sensitive, fast, accurate, and unique in that no matching, probe de-embedding, or calibration is necessary as the ratio of two on-chip signals is measured to yield the results.

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IEEE Journal of Solid-State Circuits
Department of Electronics

Amaya, R, Popplewell, P.H.R. (Peter H. R.), Cloutier, M. (Mark), & Plett, C. (2005). EM and substrate coupling in silicon RFICs. In IEEE Journal of Solid-State Circuits (Vol. 40, pp. 1968–1971). doi:10.1109/JSSC.2005.848178