2005-12-01
Delay-extraction based sensitivity analysis of multiconductor transmission lines with nonlinear terminations
Publication
Publication
Presented at the
2005 IEEE MTT-S International Microwave Symposium (June 2005)
An efficient approach is presented for time-domain sensitivity analysis of lossy multiconductor transmission lines with respect to electrical and/or physical parameters. The proposed method employs delay extraction prior to approximating the matrix exponential stamp of the line and guarantees macromodel passivity. A delay-extraction based equivalent circuit for sensitivity analysis is derived in a closed-form, leading to significant computational advantages.
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| doi.org/10.1109/MWSYM.2005.1516955 | |
| 2005 IEEE MTT-S International Microwave Symposium | |
| Organisation | Department of Electronics |
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Nakhla, N. (Natalie), Dounavis, A. (Anestis), Nakhla, M.S, & Achar, R. (2005). Delay-extraction based sensitivity analysis of multiconductor transmission lines with nonlinear terminations. In IEEE MTT-S International Microwave Symposium Digest (pp. 1427–1430). doi:10.1109/MWSYM.2005.1516955
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