Behavioral test benches for digital clock and data recovery circuits using Verilog-A
This paper presents the behavioral implementation of jitter tolerance test benches for digital clock and data recovery circuits using Verilog-A. First, we encode a variable-length Pseudo-Random Bit Sequence (PRBS) generator. Such circuits are widely used to generate test data for a variety of circuits and systems. Using this PRBS generator, we set up a test bench for the evaluation of jitter tolerance. A novel simulation methodology is described that modulates the amplitude and frequency of the jitter sinusoid iteratively to find the jitter tolerance. We conclude with a comparison of jitter tolerance simulation results, computed using various PRBS lengths, for the data recovery circuit under test.
|Keywords||Behavioral, Data recovery, Jitter tolerance, PRBS, SoC, Verilog-A|
|Conference||IEEE 2005 Custom Integrated Circuits Conference|
Ahmed, S.I., Orthner, K. (Kent), & Kwasniewski, T. (2005). Behavioral test benches for digital clock and data recovery circuits using Verilog-A. Presented at the IEEE 2005 Custom Integrated Circuits Conference. doi:10.1109/CICC.2005.1568664