Scattering loss measurement of SOI waveguides using 5×17 integrated optical star coupler

Yap, K.P.; Delâge, A.; Lamontagne, B.; Janz, S.; Xu, D.-X.; Lapointe, J.; Waldron, P.; Schmid, J.; Chow-Chong, P.; Post, E.; Syrett, Barry

doi:10.1117/12.701199

Yap, K.P., Delâge, A., Lamontagne, B., Janz, S., Xu, D.-X., Lapointe, J., Waldron, P., Schmid, J., Chow-Chong, P., Post, E., et al. B. Syrett (Barry)

2007-05-24

Scattering loss measurement of SOI waveguides using 5×17 integrated optical star coupler

Presented at the Silicon Photonics II (January 2007)

Additional Metadata
Keywords	Scattering loss, Sidewall roughness, SOI waveguides, Star coupler, Waveguide widths
Persistent URL	dx.doi.org/10.1117/12.701199
Conference	Silicon Photonics II
Organisation	Carleton University
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Yap, K.P., Delâge, A., Lamontagne, B., Janz, S., Xu, D.-X., Lapointe, J., … Syrett, B. (2007). Scattering loss measurement of SOI waveguides using 5×17 integrated optical star coupler. Presented at the Silicon Photonics II. doi:10.1117/12.701199

Scattering loss measurement of SOI waveguides using 5×17 integrated optical star coupler

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Scattering loss measurement of SOI waveguides using 5×17 integrated optical star coupler

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