In this work, properties of Ag thin-film ion exchange in Schott IOG-1 phosphate glass has been studied. Emphasis has been put on finding the proper diffusion parameters (self-diffusion coefficient for Ag+ ions and the mobility ratio between the participating ions) at process temperatures of 90°C and 230°C. In order to extract the diffusion parameters a following procedure was utilized: An ion-exchanged slab waveguide was fabricated using the same process conditions as in the case of a two-dimensional waveguide fabrication. After slab waveguide fabrication, the effective refractive indices of the propagating modes were measured by prism coupling. Thereafter, a smooth refractive index profile was constructed by improved inverse Wentzel-Kramers-Brillouin method. This refractive index profile was compared with the Ag+ ion concentration profile calculated from the diffusion equation by Crank-Nicolson method. The self-diffusion coefficient for Ag + ions and the ratio of the self-diffusion coefficients of Ag + and Na+ ions were varied until convergence between the refractive index profile and the concentration profile was found. Using the diffusion parameters obtained from these experiments, two-dimensional waveguide mode profiles were calculated by finite difference method. These theoretically obtained mode profiles were compared with the measured mode profiles with different mask opening widths.
Optical Components and Materials IV
Department of Electronics

Yliniemi, S. (Sauna), Albert, J, & Honkanen, S. (Seppo). (2007). A study of silver-film ion-exchanged glass waveguides in phosphate glass. Presented at the Optical Components and Materials IV. doi:10.1117/12.723993