Thermal stressing of bipolar transistors with metal-insulator-semiconductor heterojunction emitters

Szeto, N., Pulfrey, D.L. and N.G. Tarr (Gary)

1988-12-01

Applied Physics Letters , Volume 52 - Issue 20 p. 1664- 1666

Additional Metadata
Persistent URL	dx.doi.org/10.1063/1.99051
Journal	Applied Physics Letters
Organisation	Department of Electronics
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Szeto, N., Pulfrey, D.L., & Tarr, N.G. (1988). Thermal stressing of bipolar transistors with metal-insulator-semiconductor heterojunction emitters. Applied Physics Letters, 52(20), 1664–1666. doi:10.1063/1.99051

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