Towards a measure of biometric feature information

A. Adler (Andy), Youmaran, R. (Richard) and Loyka, S. (Sergey)

2009-01-01

Pattern Analysis and Applications , Volume 12 - Issue 3 p. 261- 270

Additional Metadata
Keywords	Biometric features, Face recognition, Information content, Relative entropy
Persistent URL	dx.doi.org/10.1007/s10044-008-0120-3
Journal	Pattern Analysis and Applications
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Adler, A, Youmaran, R. (Richard), & Loyka, S. (Sergey). (2009). Towards a measure of biometric feature information. Pattern Analysis and Applications, 12(3), 261–270. doi:10.1007/s10044-008-0120-3

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