Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS

Logan, D.F., Knights, A.P., Jessop, P.E. and N.G. Tarr (Gary)

2011-04-01

Semiconductor Science and Technology , Volume 26 - Issue 4

Additional Metadata
Persistent URL	dx.doi.org/10.1088/0268-1242/26/4/045009
Journal	Semiconductor Science and Technology
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Logan, D.F., Knights, A.P., Jessop, P.E., & Tarr, N.G. (2011). Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS. Semiconductor Science and Technology, 26(4). doi:10.1088/0268-1242/26/4/045009

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