Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS

Logan, D.F., Knights, A.P., Jessop, P.E. and N.G. Tarr (Gary)

2011-04-01

Semiconductor Science and Technology , Volume 26 - Issue 4

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Persistent URL	dx.doi.org/10.1088/0268-1242/26/4/045009
Journal	Semiconductor Science and Technology
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Logan, D.F., Knights, A.P., Jessop, P.E., & Tarr, N.G. (2011). Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS. Semiconductor Science and Technology, 26(4). doi:10.1088/0268-1242/26/4/045009

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