Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS

Logan, D.F., Knights, A.P., Jessop, P.E. and N.G. Tarr (Gary)

2011-04-01

Additional Metadata
Persistent URL	dx.doi.org/10.1088/0268-1242/26/4/045009
Journal	Semiconductor Science and Technology
Organisation	Department of Electronics
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Logan, D.F., Knights, A.P., Jessop, P.E., & Tarr, N.G. (2011). Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS. Semiconductor Science and Technology, 26(4). doi:10.1088/0268-1242/26/4/045009

Publication