Additional Metadata
Persistent URL dx.doi.org/10.1088/0268-1242/26/4/045009
Journal Semiconductor Science and Technology
Citation
Logan, D.F., Knights, A.P., Jessop, P.E., & Tarr, N.G. (2011). Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS. Semiconductor Science and Technology, 26(4). doi:10.1088/0268-1242/26/4/045009