2011-04-01
Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS
Publication
Publication
Semiconductor Science and Technology , Volume 26 - Issue 4
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dx.doi.org/10.1088/0268-1242/26/4/045009 | |
Semiconductor Science and Technology | |
Organisation | Department of Electronics |
Logan, D.F., Knights, A.P., Jessop, P.E., & Tarr, N.G. (2011). Defect-enhanced photo-detection at 1550 nm in a silicon waveguide formed via LOCOS. Semiconductor Science and Technology, 26(4). doi:10.1088/0268-1242/26/4/045009
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