A binary markov process model for random testing

Chen, S. (Sanping) and S. Mills (Shirley)

1996-12-01

IEEE Transactions on Software Engineering , Volume 22 - Issue 3 p. 218- 223

Additional Metadata
Keywords	Binary markov process, Dependent test runs, Random testing, Software reliability, Statistical testing, Ultra-reliability application
Persistent URL	dx.doi.org/10.1109/32.489081
Journal	IEEE Transactions on Software Engineering
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Chen, S. (Sanping), & Mills, S. (1996). A binary markov process model for random testing. IEEE Transactions on Software Engineering, 22(3), 218–223. doi:10.1109/32.489081

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