Additional Metadata
Keywords Binary markov process, Dependent test runs, Random testing, Software reliability, Statistical testing, Ultra-reliability application
Persistent URL dx.doi.org/10.1109/32.489081
Journal IEEE Transactions on Software Engineering
Citation
Chen, S. (Sanping), & Mills, S. (1996). A binary markov process model for random testing. IEEE Transactions on Software Engineering, 22(3), 218–223. doi:10.1109/32.489081