A binary markov process model for random testing

Chen, S. (Sanping) and S. Mills (Shirley)

1996-12-01

IEEE Transactions on Software Engineering , Volume 22 - Issue 3 p. 218- 223

Additional Metadata
Keywords	Binary markov process, Dependent test runs, Random testing, Software reliability, Statistical testing, Ultra-reliability application
Persistent URL	dx.doi.org/10.1109/32.489081
Journal	IEEE Transactions on Software Engineering
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Chen, S. (Sanping), & Mills, S. (1996). A binary markov process model for random testing. IEEE Transactions on Software Engineering, 22(3), 218–223. doi:10.1109/32.489081

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