1996-12-01
A binary markov process model for random testing
Publication
Publication
IEEE Transactions on Software Engineering , Volume 22 - Issue 3 p. 218- 223
Additional Metadata | |
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Binary markov process, Dependent test runs, Random testing, Software reliability, Statistical testing, Ultra-reliability application | |
dx.doi.org/10.1109/32.489081 | |
IEEE Transactions on Software Engineering | |
Organisation | School of Mathematics and Statistics |
Chen, S. (Sanping), & Mills, S. (1996). A binary markov process model for random testing. IEEE Transactions on Software Engineering, 22(3), 218–223. doi:10.1109/32.489081
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