A description is given of a system which employs open-balanced transmission line structures and UHF CW phase measurement techniques to determine either the thickness or dielectric constant or moisture content of film or slab-like materials in the thickness range of 1 to 400 mil and the relative dielectric constant range of approximately 2 to 20. Both experimental and analytical results are presented. Copyright

Additional Metadata
Persistent URL dx.doi.org/10.1109/TIM.1979.4314754
Journal IEEE Transactions on Instrumentation and Measurement
Citation
Chudobiak, W.J. (Walter J.), Beshir, M.R., & Wight, J. S. (1979). An Open Transmission Line UHF CW Phase Technique for Thickness/Dielectric Constant Measurement. IEEE Transactions on Instrumentation and Measurement, 28(1), 18–25. doi:10.1109/TIM.1979.4314754