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Wylie, I.W. and E.P.C. Lai (Edward)

1986-06-01

PHOTOACOUSTIC TECHNIQUE TO EXAMINE ION-IMPLANTED SILICON WAFERS.

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Chemtronics , Volume 1 - Issue 2 p. 69- 75

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Journal Chemtronics
Organisation Carleton University
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Wylie, I.W., & Lai, E.P.C. (1986). PHOTOACOUSTIC TECHNIQUE TO EXAMINE ION-IMPLANTED SILICON WAFERS. Chemtronics, 1(2), 69–75.


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